MC 2023 Darmstadt

You are cordially invited to join us at Microscopy Conference 2023, taking place in Darmstadt from February 27th to March 2nd, where TESCAN is a proud diamond sponsor

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The TESCAN Global Team is excited to meet you. We have added our staff's personal participation, scientific presentations, and various demo opportunities to the event's agenda.

 

Highlights you’ll see at TESCAN’s booth #E0-1 during the conference include:

 

  • A demo of our newly released TENSOR 4D-STEM, designed to address the needs of anyone with an interest in multimodal nano-characterization applications (morphological, chemical, and structural), including materials scientists, semiconductor R&D and failure analysis engineers, and crystallographers; 

  • The TESCAN UniTOM HR will be showcased, a versatile micro-CT system that combines high spatial resolution with high temporal resolution that is optimized for static and dynamic imaging, fulfilling all of the necessary imaging requirements;

  • Learn about our Battery Research Analytical Workflow, by leveraging a unique combination of high current FIB, field-free UHR SEM, and integrated TOF-SIMS,

 

 

TESCAN product and applications specialists will be at the booth to discuss your needs and answer any questions you may have. Additionally, we will be hosting lunchtime lectures and demos of TESCAN TENSOR, the first integrated analytical 4D-STEM in the world. Don't miss out on this unique opportunity to learn and explore the latest advancements in microscopy technology. 
 
We look forward to seeing you at the conference.

In-booth agenda - register for a demo

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TESCAN TENSOR

Experience an exclusive TENSOR demo. The first near-UHV 4D-STEM at booth E1-24.

 

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Register for a demo
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TESCAN TENSOR

Registration form

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TESCAN AMBER with Glove Box

Explore with us how TESCAN AMBER with TOF-SIMS is crucial for battery research at the E0-1 booth.

 

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Register for a demo
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TESCAN AMBER with Glove Box

Registration form

Learn with us

Monday February 27
12:45 - 13:45
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Resolution, Speed, Image Quality, and System Versatility in micro-CT

Copernicum, level 0
60 mins, 250 pax
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Monday February 27
12:45 - 13:45
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CryoTEM sample preparation by FIB-SEM

Mini LL Chromium, level 2
60 mins, 90 pax
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Micro CT

Registration form

Tuesday February 28
12:45 - 13:45
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TESCAN TENSOR: The Integrated, Precession-Assisted, Analytical 4D-STEM

Spectrum A (level 1)
60 mins, 800 pax
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Micro CT

Registration form

Tuesday February 28
12:45 - 13:45
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3D tomography of large volumes 

Mini LL Chromium, level 2
60 mins, 90 pax
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Micro CT

Registration form

Wednesday March 1
12:45 - 13:45
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The role of Electron Microscopy and Focused ion beam characterization methods in the evaluation of electrochemical materials and their interphases

LL Copernicum, level 0
60 mins, 250 pax
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Micro CT

Registration form

Thursday March 2
12:45 - 13:45
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Achieve the highest quality and throughput in TEM lamella preparation using TESCANs automation and unique lift out method

Mini LL Chromium, level 2
60 mins, 90 pax
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Micro CT

Registration form

Scientific talk

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Tuesday February 28
18:45-19:15

Faster mm-scale defect/failure analysis by combining plasma FIB milling and Laser Ablation

LL Copernicum, level 0
20 mins, 250 pax
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Micro CT

Registration form

Our speakers

Jakub Javurek photo
Jakub Javůrek
Product Marketing Manager - Life Sciences

Jakub Javurek is a Product Marketing Manager for 2D & 3D Cell and Tissue Characterization.  His primary focus was on SEM and FIB-SEM analyses of sensitive biological materials.

  • topic 3D tomography of large volumes 
  • calendar_month Tuesday 28 at 12:45
  • where_to_vote Mini LL Chromium, level 2
  • schedule 60 mins, 90 pax
Martin Slama photo
Martin Sláma
Product Marketing Manager for FIB-SEM 3D characterization and TEM lamella preparation in Materials science

Martin Sláma works as a Product Marketing Manager for FIB-SEM 3D characterization and TEM lamella preparation in Materials science with over 6 years of experience working with the FIB-SEM instruments. 

  • topic Achieve the highest quality and througput in TEM lamella preparation using TESCANs automation and unique lift out method
  • calendar_month Wednesday March 1 at 12:00
  • where_to_vote Chromium (level 2)
  • schedule 60 mins, 90 pax
Lars Oliver photo
Lars-Oliver Kautschor
Sales Development Manager

Lars-Oliver Kautschor is sales development manager for TESCAN’s Micro-CT product lines. He has over 10 years of experience in the field of X-ray microscopy and Micro-CT industries.

  • topic Resolution, Speed, Image Quality, and System Versatility in micro-CT
  • calendar_month Monday February 27 at 12:45
  • where_to_vote LL Copernicum, level 0
  • schedule 60 mins, 250 pax
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Dirk van der Wal
Chief Marketing Officer

Dirk van der Wal is Chief Marketing Officer at TESCAN Orsay Holding a.s. He had held application specialist, product management, and product marketing roles at different companies in the Electron Microscopy industry.

  • TESCAN TENSOR: The Integrated, Precession-Assisted, Analytical 4D-STEM
  • calendar_month Tuesday February 28 at 12:45
  • where_to_vote Spectrum A (level 1)
  • schedule 60 mins, 800 pax
Sulak photo
Ondřej Šulák
Product Marketing Director - Life Sciences

In 2016, Ondrej joined TESCAN as Global Applications Director. Since January 2019 he works as Product Marketing Director for the Life Sciences segment.

 

  • topic CryoTEM sample preparation by FIB-SEM
  • calendar_month Tuesday 27 at 12:45
  • where_to_vote Mini LL Chromium, level 2
  • schedule 60 mins, 90 pax
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Tomáš Šamořil
Product Marketing Manager - Materials Science

Tomáš is with TESCAN since 2009. He has a background in nanotechnology, nanoprototyping by use of electron or ion beam-based lithography methods and ToF-SIMS technique. 

  • topic The role of Electron Microscopy and Focused ion beam characterization methods in the evaluation of electrochemical materials and their interphases
  • calendar_month Wednesday 1 at 12:45
  • where_to_vote LL Copernicum, level 0
  • schedule 60 mins, 250 pax
Petr Klímek photo
Petr Klímek
Product Marketing Director - Materials & Geo Sciences

Petr Klímek is a Product Marketing Director at TESCAN ORSAY HOLDING in Brno, Czech Republic. His previous positions—Application Specialist and Product Manager for TESCAN SEMs—provided him with substantial insight into electron microscopy, its applications, and its overall benefits for various microanalytical tasks.

  • Faster mm-scale defect/failure analysis by combining plasma FIB milling and Laser Ablation
  • calendar_month Tuesday February 28 at 18:45
  • where_to_vote Copernicum (level 0)
  • schedule 20 mins, 250 pax

Where to meet

Darmstadtium - Science and Congress Center

Schloßgraben 1, 64283 Darmstadt, Germany

 

Floor plan, booth no. E0-1

 

Floor plan, booth no. E1-24

 

Not attending?

 

If you are unable to attend this conference, we will be happy to contact you, if you have any questions or requests.